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- 81600033 contributor B4141331.
- 81600033 contributor B4141332.
- 81600033 contributor B4141333.
- 81600033 created "1981.".
- 81600033 date "1981".
- 81600033 date "1981.".
- 81600033 dateCopyrighted "1981.".
- 81600033 description "Includes bibliographical references.".
- 81600033 extent "iv, 14 p. :".
- 81600033 isPartOf "NBS special publication ; 400-68".
- 81600033 isPartOf "Semiconductor measurement technology".
- 81600033 issued "1981".
- 81600033 issued "1981.".
- 81600033 language "eng".
- 81600033 publisher "Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O.,".
- 81600033 subject "Integrated circuits Testing.".
- 81600033 subject "Probes (Electronic instruments)".
- 81600033 subject "QC100 .U57 no. 400-68 TK7874".
- 81600033 title "A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.".
- 81600033 type "text".