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- 82008723 contributor B4175811.
- 82008723 contributor B4175812.
- 82008723 created "1982.".
- 82008723 date "1982".
- 82008723 date "1982.".
- 82008723 dateCopyrighted "1982.".
- 82008723 description "Bibliography: p. 235-295.".
- 82008723 extent "xix, 300 p. :".
- 82008723 identifier "0122526805".
- 82008723 identifier 82008723.html.
- 82008723 identifier 82008723.html.
- 82008723 issued "1982".
- 82008723 issued "1982.".
- 82008723 language "eng".
- 82008723 publisher "New York : Academic Press,".
- 82008723 subject "620.1/1299 19".
- 82008723 subject "Channeling (Physics)".
- 82008723 subject "Crystallography.".
- 82008723 subject "Crystals Defects.".
- 82008723 subject "Ion bombardment.".
- 82008723 subject "QC176.8.C45 F44 1982".
- 82008723 subject "Solids Surfaces.".
- 82008723 title "Materials analysis by ion channeling : submicron crystallography / Leonard C. Feldman, James W. Mayer, S. Thomas Picraux.".
- 82008723 type "text".