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- 82010782 contributor B4178426.
- 82010782 created "1982.".
- 82010782 date "1982".
- 82010782 date "1982.".
- 82010782 dateCopyrighted "1982.".
- 82010782 description "Includes bibliographical references and index to v. 1-6 of series.".
- 82010782 extent "115 p. :".
- 82010782 identifier "0387117121 (U.S.)".
- 82010782 isPartOf "Crystals ; 6".
- 82010782 issued "1982".
- 82010782 issued "1982.".
- 82010782 language "eng".
- 82010782 publisher "Berlin ; New York : Springer-Verlag,".
- 82010782 subject "502/.8/2 19".
- 82010782 subject "Field ion microscopy.".
- 82010782 subject "Materials Microscopy.".
- 82010782 subject "QD921 .C8 vol. 6 TA417.23".
- 82010782 title "Field-ion microscopy / by R. Wagner.".
- 82010782 type "text".