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- 83083128 contributor B4437531.
- 83083128 created "c1984]".
- 83083128 date "1984".
- 83083128 date "c1984]".
- 83083128 dateCopyrighted "c1984]".
- 83083128 description "Includes bibliographies and index.".
- 83083128 extent "vii, 153 p. :".
- 83083128 identifier "0895733072 (Philips Electronic Instruments)".
- 83083128 identifier "3527262245".
- 83083128 issued "1984".
- 83083128 issued "c1984]".
- 83083128 language "eng".
- 83083128 publisher "[Weinheim, Basel] : Verlag Chemie International ; [Deerfield Beach, Fla. : Electron Optics Pub. Co.,".
- 83083128 subject "620.1/1/0287 19".
- 83083128 subject "Electron microscopy.".
- 83083128 subject "Materials Microscopy.".
- 83083128 subject "TA417.23 .W55 1984".
- 83083128 title "Practical analytical electron microscopy in materials science / David B. Williams.".
- 83083128 type "text".