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- 83120666 alternative "Electronics test.".
- 83120666 contributor B4458465.
- 83120666 created "c1983.".
- 83120666 date "1983".
- 83120666 date "c1983.".
- 83120666 dateCopyrighted "c1983.".
- 83120666 description "Includes bibliographical references.".
- 83120666 extent "300 p. in various pagings :".
- 83120666 issued "1983".
- 83120666 issued "c1983.".
- 83120666 language "eng".
- 83120666 publisher "New York, NY (2 Park Ave., New York 10016) : Morgan-Grampian Pub. Co.,".
- 83120666 subject "621.381/028/7 19".
- 83120666 subject "Automatic test equipment Congresses.".
- 83120666 subject "Electronic apparatus and appliances Testing Congresses.".
- 83120666 subject "TK7836 .A87 1983".
- 83120666 title "Proceedings / ATE West, Automated Testing for Electronics Manufacturing Conference, January 10-13, 1983, Anaheim Convention Center, Anaheim, CA ; sponsored by Electronics test.".
- 83120666 type "text".