Matches in Library of Congress for { <http://lccn.loc.gov/83178013> ?p ?o. }
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- 83178013 alternative "Electronics test.".
- 83178013 contributor B4516126.
- 83178013 created "c1983.".
- 83178013 date "1983".
- 83178013 date "c1983.".
- 83178013 dateCopyrighted "c1983.".
- 83178013 description "Includes bibliographical references.".
- 83178013 extent "235 p. in various pagings :".
- 83178013 issued "1983".
- 83178013 issued "c1983.".
- 83178013 language "eng".
- 83178013 publisher "New York, NY (2 Park Ave., New York 10016) : Morgan-Grampian Pub. Co.,".
- 83178013 subject "621.381/0287 19".
- 83178013 subject "Automatic test equipment Congresses.".
- 83178013 subject "TK7895.A8 A87 1983".
- 83178013 title "Proceedings / ATE East, Automated Testing for Electronics Manufacturing Conference, June 13-16, 1983, John B. Hynes Veterans' Auditorium & Boston-Sheraton Hotel, Boston, MA ; sponsored by Electronics test.".
- 83178013 type "text".