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- 84080983%2F%2Fr90 contributor B4669372.
- 84080983%2F%2Fr90 created "c1984.".
- 84080983%2F%2Fr90 date "1984".
- 84080983%2F%2Fr90 date "c1984.".
- 84080983%2F%2Fr90 dateCopyrighted "c1984.".
- 84080983%2F%2Fr90 description "Includes bibliographies.".
- 84080983%2F%2Fr90 extent "viii, 315 p. :".
- 84080983%2F%2Fr90 identifier "0818605731 (pbk.)".
- 84080983%2F%2Fr90 identifier "0818645733 (microfiche)".
- 84080983%2F%2Fr90 issued "1984".
- 84080983%2F%2Fr90 issued "c1984.".
- 84080983%2F%2Fr90 language "eng".
- 84080983%2F%2Fr90 publisher "Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society,".
- 84080983%2F%2Fr90 subject "621.3819/5835/0287 19".
- 84080983%2F%2Fr90 subject "Logic circuits Testing.".
- 84080983%2F%2Fr90 subject "TK7888.4 .S45 1984".
- 84080983%2F%2Fr90 title "Selected reprints on logic design for testability / compiled by Constantin C. Timoc.".
- 84080983%2F%2Fr90 type "text".