Matches in Library of Congress for { <http://lccn.loc.gov/84221575> ?p ?o. }
Showing items 1 to 17 of
17
with 100 items per page.
- 84221575 contributor B4800322.
- 84221575 contributor B4800323.
- 84221575 created "c1982.".
- 84221575 date "1982".
- 84221575 date "c1982.".
- 84221575 dateCopyrighted "c1982.".
- 84221575 description "Bibliography: p. 225.".
- 84221575 extent "iii leaves, 227 p. :".
- 84221575 issued "1982".
- 84221575 issued "c1982.".
- 84221575 language "eng".
- 84221575 publisher "Campbell, Calif., USA (96 Shereen Pl., Campbell 95008) : Logical Solutions,".
- 84221575 subject "621.381/73 19".
- 84221575 subject "Integrated circuits Testing.".
- 84221575 subject "TK7874 .T83 1982".
- 84221575 title "Design to test : a definitive guide for the improvement of productivity in electronics manufacturing / by Jon Turino and H. Frank Binnendyk.".
- 84221575 type "text".