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- 85062324 contributor B4911497.
- 85062324 contributor B4911498.
- 85062324 created "1985.".
- 85062324 date "1985".
- 85062324 date "1985.".
- 85062324 dateCopyrighted "1985.".
- 85062324 description "Includes bibliographies and index.".
- 85062324 extent "xxx, 988 p. :".
- 85062324 identifier "081860641X (pbk.)".
- 85062324 identifier "0818646411 (microfiche)".
- 85062324 issued "1985".
- 85062324 issued "1985.".
- 85062324 language "eng".
- 85062324 publisher "Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society,".
- 85062324 subject "621.381/73 19".
- 85062324 subject "Integrated circuits Testing Congresses.".
- 85062324 subject "Semiconductors Testing Congresses.".
- 85062324 subject "TK7874 .I593 1985".
- 85062324 title "The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 / sponsored by the IEEE Computer Society, IEEE Philadelphia Section.".
- 85062324 type "text".