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- 85234904 contributor B5066803.
- 85234904 contributor B5066804.
- 85234904 contributor B5066805.
- 85234904 created "[c1985]".
- 85234904 date "1985".
- 85234904 date "[c1985]".
- 85234904 dateCopyrighted "[c1985]".
- 85234904 description "Fundamentals of environmental stress screening / C.E. (Neil) Mandel, Jr. -- Defect related failure mechanisms in electronic materials accelerated during environmental stress screening / B.R. Livesay.".
- 85234904 extent "iv, 107 p. :".
- 85234904 identifier "0915414856 (pbk.)".
- 85234904 issued "1985".
- 85234904 issued "[c1985]".
- 85234904 language "eng".
- 85234904 publisher "[Mount Prospect, IL] : The Institute,".
- 85234904 subject "Environmental testing.".
- 85234904 subject "Reliability (Engineering)".
- 85234904 subject "TA171 .M36 1985".
- 85234904 tableOfContents "Fundamentals of environmental stress screening / C.E. (Neil) Mandel, Jr. -- Defect related failure mechanisms in electronic materials accelerated during environmental stress screening / B.R. Livesay.".
- 85234904 title "Environmental stress screening : a tutorial / Institute of Environmental Sciences.".
- 85234904 type "text".