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- 86001811 contributor B5134417.
- 86001811 created "c1986.".
- 86001811 date "1986".
- 86001811 date "c1986.".
- 86001811 dateCopyrighted "c1986.".
- 86001811 description "Bibliography: p. [223]-284.".
- 86001811 extent "xviii, 349 p. :".
- 86001811 identifier "0387158332 (U.S.)".
- 86001811 isPartOf "Inorganic chemistry concepts ; v. 9".
- 86001811 issued "1986".
- 86001811 issued "c1986.".
- 86001811 language "eng".
- 86001811 publisher "Berlin ; New York : Springer-Verlag,".
- 86001811 subject "539.7/222 19".
- 86001811 subject "Extended X-ray absorption fine structure.".
- 86001811 subject "QC482.S6 T45 1986".
- 86001811 title "EXAFS : basic principles and data analysis / Boon K. Teo.".
- 86001811 type "text".