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- 86011014 contributor B5145873.
- 86011014 contributor B5145874.
- 86011014 created "1987.".
- 86011014 date "1987".
- 86011014 date "1987.".
- 86011014 dateCopyrighted "1987.".
- 86011014 description "Bibliography: p. 1125-1216.".
- 86011014 extent "xxxv, 1227 p. :".
- 86011014 identifier "0471010561".
- 86011014 identifier 86011014.html.
- 86011014 identifier 86011014-b.html.
- 86011014 identifier 86011014.html.
- 86011014 isPartOf "Chemical analysis ; v. 86".
- 86011014 issued "1987".
- 86011014 issued "1987.".
- 86011014 language "eng".
- 86011014 publisher "New York : J. Wiley,".
- 86011014 subject "543/.0873 19".
- 86011014 subject "QD96.S43 B46 1987".
- 86011014 subject "Secondary ion mass spectrometry.".
- 86011014 title "Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner.".
- 86011014 type "text".