Matches in Library of Congress for { <http://lccn.loc.gov/86135779> ?p ?o. }
Showing items 1 to 17 of
17
with 100 items per page.
- 86135779 contributor B5228428.
- 86135779 contributor B5228429.
- 86135779 created "1979.".
- 86135779 date "1979".
- 86135779 date "1979.".
- 86135779 dateCopyrighted "1979.".
- 86135779 description "Bibliography: p. 210-215.".
- 86135779 extent "216 p. :".
- 86135779 issued "1979".
- 86135779 issued "1979.".
- 86135779 language "rus".
- 86135779 publisher "Moskva : Izd-vo standartov,".
- 86135779 subject "Integrated circuits Reliability.".
- 86135779 subject "Semiconductors Reliability.".
- 86135779 subject "TK7874 .E363 1979".
- 86135779 title "Nadezhnostʹ tverdykh integralʹnykh skhem / I.E. Efimov, I.G. Kalʹman, V.I. Martynov.".
- 86135779 type "text".