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- 86205417 contributor B5305185.
- 86205417 contributor B5305186.
- 86205417 contributor B5305187.
- 86205417 contributor B5305188.
- 86205417 created "1985.".
- 86205417 date "1985".
- 86205417 date "1985.".
- 86205417 dateCopyrighted "1985.".
- 86205417 description "Includes bibliographies.".
- 86205417 description "Use of Monte Carlo calculations for the simulation of electron trajectory in solids / F. Maurice -- Monte Carlo simulation of matrix effects in X-ray microanalysis / J. Paduch, E. Barszcz -- In-depth analysis of layered samples using the electron microprobe / J.L. Pouchou -- Quantitative microanalysis of very light elements / J. Ruste -- Quantitative electron-probe microanalysis, including the light elements / V.D. Scott, D.A. Sewell, G. Love -- Calculation of the theoretical precision for relative intensity in electron microprobe analysis / K. Stróż -- Quantitative X-ray microanalysis of thin coatings / K. Sikorski, A. Szummer -- Electron channeling patterns and crystallographic contrast of scanning electron microscopy / E. Vicario -- Digital images from electron microprobe applied to metallurgy / D. Benoit ... [et al.] -- The influence of the oxidation and doping with Ca and Mg on X-ray L-emission spectra of iron and manganese oxides / S. Jasieńska, D. Tomkowicz -- Investigation of phase precipitated in the tool steels during the laser beam heating / J. Kusiński.".
- 86205417 extent "112 p. :".
- 86205417 issued "1985".
- 86205417 issued "1985.".
- 86205417 language "eng".
- 86205417 publisher "Kraków : Wydawn. AGH.,".
- 86205417 subject "620.1/1272 19".
- 86205417 subject "Layer structure (Solids) Congresses.".
- 86205417 subject "QD96.X2 P65 1984".
- 86205417 subject "X-ray microanalysis Congresses.".
- 86205417 tableOfContents "Use of Monte Carlo calculations for the simulation of electron trajectory in solids / F. Maurice -- Monte Carlo simulation of matrix effects in X-ray microanalysis / J. Paduch, E. Barszcz -- In-depth analysis of layered samples using the electron microprobe / J.L. Pouchou -- Quantitative microanalysis of very light elements / J. Ruste -- Quantitative electron-probe microanalysis, including the light elements / V.D. Scott, D.A. Sewell, G. Love -- Calculation of the theoretical precision for relative intensity in electron microprobe analysis / K. Stróż -- Quantitative X-ray microanalysis of thin coatings / K. Sikorski, A. Szummer -- Electron channeling patterns and crystallographic contrast of scanning electron microscopy / E. Vicario -- Digital images from electron microprobe applied to metallurgy / D. Benoit ... [et al.] -- The influence of the oxidation and doping with Ca and Mg on X-ray L-emission spectra of iron and manganese oxides / S. Jasieńska, D. Tomkowicz -- Investigation of phase precipitated in the tool steels during the laser beam heating / J. Kusiński.".
- 86205417 title "Proceedings / Polish-French Seminary [sic] on X-ray Microanalysis, Kozubnik, Poland, September 12, 1984 ; edited by S. Jasieńska and H. Klimczyk.".
- 86205417 type "text".