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- 87023013 contributor B5405047.
- 87023013 contributor B5405048.
- 87023013 created "c1987.".
- 87023013 date "1987".
- 87023013 date "c1987.".
- 87023013 dateCopyrighted "c1987.".
- 87023013 description "Bibliography: p. 339-345.".
- 87023013 extent "xiii, 354 p. :".
- 87023013 identifier "0471624632".
- 87023013 identifier 87023013.html.
- 87023013 identifier 87023013.html.
- 87023013 issued "1987".
- 87023013 issued "c1987.".
- 87023013 language "eng".
- 87023013 publisher "New York : Wiley,".
- 87023013 subject "621.381/73 19".
- 87023013 subject "Integrated circuits Very large scale integration Testing.".
- 87023013 subject "TK7874 .B374 1987".
- 87023013 title "Built-in test for VLSI : pseudorandom techniques / Paul H. Bardell, William H. McAnney, Jacob Savir.".
- 87023013 type "text".