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- 87072162 contributor B5432785.
- 87072162 created "c1987.".
- 87072162 date "1987".
- 87072162 date "c1987.".
- 87072162 dateCopyrighted "c1987.".
- 87072162 description "Includes bibliographical references (p. [407]-431).".
- 87072162 extent "x, 440 p. :".
- 87072162 identifier "0124967353".
- 87072162 isPartOf "Perspectives in computing (Boston, Mass.) ; vol. 18.".
- 87072162 isPartOf "Perspectives in computing ; vol. 18".
- 87072162 issued "1987".
- 87072162 issued "c1987.".
- 87072162 language "eng".
- 87072162 publisher "London ; San Diego : Academic Press,".
- 87072162 subject "621.381/5/0287 20".
- 87072162 subject "Integrated circuits Testing.".
- 87072162 subject "TK7874 .D48 1987".
- 87072162 title "Developments in integrated circuit testing / D.M. Miller, editor.".
- 87072162 type "text".