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- 88061362 alternative "Test generation for VLSI chips.".
- 88061362 contributor B5657975.
- 88061362 contributor B5657976.
- 88061362 created "c1988.".
- 88061362 date "1988".
- 88061362 date "c1988.".
- 88061362 dateCopyrighted "c1988.".
- 88061362 description "Bibliography: p. 333-394.".
- 88061362 extent "x, 401 p. :".
- 88061362 identifier "0818647868 (microfiche)".
- 88061362 identifier "081868786X".
- 88061362 issued "1988".
- 88061362 issued "c1988.".
- 88061362 language "eng".
- 88061362 publisher "Washington, D.C. : Computer Society Press ; Los Angeles, CA : Order from Computer Society,".
- 88061362 subject "621.39/5/0287 20".
- 88061362 subject "Automatic test equipment.".
- 88061362 subject "Integrated circuits Very large scale integration Testing.".
- 88061362 subject "TK7874 .T8857 1988".
- 88061362 title "Tutorial test generation for VLSI chips / [edited by] Vishwani D. Agrawal and Sharad C. Seth.".
- 88061362 type "text".