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- 89022460 contributor B5864570.
- 89022460 contributor B5864571.
- 89022460 created "c1989.".
- 89022460 date "1989".
- 89022460 date "c1989.".
- 89022460 dateCopyrighted "c1989.".
- 89022460 description "Includes bibliographical references.".
- 89022460 extent "1 v. (various pagings) :".
- 89022460 identifier "0471519456".
- 89022460 identifier 89022460.html.
- 89022460 identifier 89022460.html.
- 89022460 identifier 89022460.html.
- 89022460 issued "1989".
- 89022460 issued "c1989.".
- 89022460 language "eng".
- 89022460 publisher "New York : Wiley,".
- 89022460 subject "543/.0873 20".
- 89022460 subject "QD96.S43 W55 1989".
- 89022460 subject "Secondary ion mass spectrometry.".
- 89022460 title "Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis / R.G. Wilson, F.A. Stevie, C.W. Magee.".
- 89022460 type "text".