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- 89024589 contributor B5867270.
- 89024589 contributor B5867271.
- 89024589 created "c1990.".
- 89024589 date "1990".
- 89024589 date "c1990.".
- 89024589 dateCopyrighted "c1990.".
- 89024589 description "Includes bibliographical references.".
- 89024589 extent "ix, 575 p. :".
- 89024589 identifier "0792305361 (alk. paper)".
- 89024589 isPartOf "NATO ASI series. Series E, Applied sciences ; no. 175.".
- 89024589 isPartOf "NATO ASI series. Series E: Applied sciences ; vol. 175".
- 89024589 issued "1990".
- 89024589 issued "c1990.".
- 89024589 language "eng".
- 89024589 publisher "Dordrecht ; Boston : Kluwer Academic Publishers,".
- 89024589 subject "621.381/52 20".
- 89024589 subject "Semiconductors Reliability Congresses.".
- 89024589 subject "TK7871.85 .N3758 1989".
- 89024589 title "Semiconductor device reliability / edited by A. Christou and B.A. Unger.".
- 89024589 type "text".