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- 89024726 contributor B5867456.
- 89024726 contributor B5867457.
- 89024726 created "c1990.".
- 89024726 date "1990".
- 89024726 date "c1990.".
- 89024726 dateCopyrighted "c1990.".
- 89024726 description "Includes bibliographical references (p. [149]-155).".
- 89024726 extent "x, 159 p. :".
- 89024726 identifier "079239058X".
- 89024726 isPartOf "The Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.".
- 89024726 issued "1990".
- 89024726 issued "c1990.".
- 89024726 language "eng".
- 89024726 publisher "Boston : Kluwer Academic Publishers,".
- 89024726 subject "621.39/5/0287 20".
- 89024726 subject "Integrated circuits Very large scale integration Computer simulation.".
- 89024726 subject "Integrated circuits Very large scale integration Testing.".
- 89024726 subject "TK7874 .B484 1990".
- 89024726 title "Hierarchical modeling for VLSI circuit testing / by Debashis Bhattacharya, John P. Hayes.".
- 89024726 type "text".