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- 89024881 contributor B5867643.
- 89024881 created "c1990.".
- 89024881 date "1990".
- 89024881 date "c1990.".
- 89024881 dateCopyrighted "c1990.".
- 89024881 description "Includes bibliographical references and index.".
- 89024881 extent "xv, 599 p. :".
- 89024881 identifier "0471511048".
- 89024881 identifier 89024881-b.html.
- 89024881 identifier 89024881-d.html.
- 89024881 identifier 89024881-t.html.
- 89024881 issued "1990".
- 89024881 issued "c1990.".
- 89024881 language "eng".
- 89024881 publisher "New York : Wiley,".
- 89024881 subject "621.381/52 20".
- 89024881 subject "QC611 .S335 1990".
- 89024881 subject "Semiconductors Testing.".
- 89024881 subject "Semiconductors.".
- 89024881 title "Semiconductor material and device characterization / Dieter K. Schroder.".
- 89024881 type "text".