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- 89025259 contributor B5868123.
- 89025259 contributor B5868124.
- 89025259 created "c1990.".
- 89025259 date "1990".
- 89025259 date "c1990.".
- 89025259 dateCopyrighted "c1990.".
- 89025259 description "Includes bibliographical references (p. 644-645) and index.".
- 89025259 extent "xxi, 653 p. :".
- 89025259 identifier "0716781794 :".
- 89025259 isPartOf "Electrical engineering communications and signal processing series.".
- 89025259 isPartOf "Electrical engineering, communications, and signal processing".
- 89025259 issued "1990".
- 89025259 issued "c1990.".
- 89025259 language "eng".
- 89025259 publisher "New York, NY : Computer Science Press,".
- 89025259 subject "621.381/5 20".
- 89025259 subject "Digital integrated circuits Design and construction.".
- 89025259 subject "Digital integrated circuits Testing.".
- 89025259 subject "TK7874 .A23 1990".
- 89025259 title "Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.".
- 89025259 type "text".