Matches in Library of Congress for { <http://lccn.loc.gov/89061749> ?p ?o. }
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- 89061749 alternative "Circuits manufacturing.".
- 89061749 alternative "EOS/ESD technology.".
- 89061749 alternative "Electronics test.".
- 89061749 alternative "Test 1989.".
- 89061749 contributor B5894187.
- 89061749 contributor B5894188.
- 89061749 created "c1989.".
- 89061749 date "1989".
- 89061749 date "c1989.".
- 89061749 dateCopyrighted "c1989.".
- 89061749 description "Includes bibliographical references and index.".
- 89061749 extent "xi, 561 p. :".
- 89061749 identifier "0879302135".
- 89061749 issued "1989".
- 89061749 issued "c1989.".
- 89061749 language "eng".
- 89061749 publisher "Boston, MA : MG Expositions Group,".
- 89061749 subject "Automatic test equipment Congresses.".
- 89061749 subject "Electronic apparatus and appliances Testing Congresses.".
- 89061749 subject "Electronic instruments Congresses.".
- 89061749 subject "TK7878.4 .A86 1989".
- 89061749 title "Winning test solutions for the '90s / ATE & Instrumentation Conference proceedings / ATE & Instrumentation Conference East ; June 19-22, 1989, World Trade Center, Boston, MA ; sponsored by Electronics test, Circuits manufacturing, and EOS/ESD technology magazines ; endorsed by the American Society of Test Engineers.".
- 89061749 type "text".