Matches in Library of Congress for { <http://lccn.loc.gov/89083677> ?p ?o. }
Showing items 1 to 19 of
19
with 100 items per page.
- 89083677 contributor B5903177.
- 89083677 contributor B5903178.
- 89083677 created "c1989.".
- 89083677 date "1989".
- 89083677 date "c1989.".
- 89083677 dateCopyrighted "c1989.".
- 89083677 description "Includes bibliographical references.".
- 89083677 extent "xxxiv, 959 p. :".
- 89083677 identifier "0818689625".
- 89083677 issued "1989".
- 89083677 issued "c1989.".
- 89083677 language "eng".
- 89083677 publisher "Washington : IEEE Computer Society Press,".
- 89083677 subject "620/.0044 20".
- 89083677 subject "Automatic test equipment Congresses.".
- 89083677 subject "Integrated circuits Testing Congresses.".
- 89083677 subject "TK7874 .I593 1989".
- 89083677 title "Meeting the tests of time : International Test Conference 1989 proceedings : August 29-31, 1989 : Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.".
- 89083677 type "text".