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- 89083803 alternative "Reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies.".
- 89083803 contributor B5903298.
- 89083803 contributor B5903299.
- 89083803 created "c1989.".
- 89083803 date "1989".
- 89083803 date "c1989.".
- 89083803 dateCopyrighted "c1989.".
- 89083803 description "Includes bibliographical references.".
- 89083803 extent "viii, 495 p. :".
- 89083803 isPartOf "Proceedings (Electrochemical Society) ; v. 89-6.".
- 89083803 isPartOf "Proceedings ; v. 89-6".
- 89083803 issued "1989".
- 89083803 issued "c1989.".
- 89083803 language "eng".
- 89083803 publisher "Pennington, NJ (10 S. Main St., Pennington 08534-2896) : Electrochemical Society,".
- 89083803 subject "621.381/52 20".
- 89083803 subject "Integrated circuits Very large scale integration Design and construction Congresses.".
- 89083803 subject "Metallizing Congresses.".
- 89083803 subject "Semiconductors Reliability Congresses.".
- 89083803 subject "TK7871.85 .P7485 1989".
- 89083803 title "Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies / edited by Harzara S. Rathore, Geraldine C. Schwartz, Robin A. Susko ; [sponsored by] Dielectrics and Insulation and Electronics divisions.".
- 89083803 type "text".