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- 89147603 contributor B5957811.
- 89147603 contributor B5957812.
- 89147603 created "c1989.".
- 89147603 date "1989".
- 89147603 date "c1989.".
- 89147603 dateCopyrighted "c1989.".
- 89147603 description "Includes bibliographical references (p. 275-292) and indexes.".
- 89147603 extent "vii, 299 p. :".
- 89147603 identifier "0120145820".
- 89147603 isPartOf "Advances in electronics and electron physics. Supplement ; 20".
- 89147603 issued "1989".
- 89147603 issued "c1989.".
- 89147603 language "eng".
- 89147603 publisher "Boston : Academic Press,".
- 89147603 subject "502/.8/2 20".
- 89147603 subject "Atom-probe field ion microscopy.".
- 89147603 subject "QH212.A76 S25 1989".
- 89147603 title "Atom-probe field ion microscopy and its applications / Toshio Sakurai, A. Sakai, H.W. Pickering.".
- 89147603 type "text".