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- 89600743%2F%2Fr912 contributor B6035431.
- 89600743%2F%2Fr912 created "[1989]".
- 89600743%2F%2Fr912 date "1989".
- 89600743%2F%2Fr912 date "[1989]".
- 89600743%2F%2Fr912 dateCopyrighted "[1989]".
- 89600743%2F%2Fr912 description "Includes bibliographical references (p. 244-246).".
- 89600743%2F%2Fr912 extent "v, 246 p. ;".
- 89600743%2F%2Fr912 isPartOf "NIST special publication ; 400-83".
- 89600743%2F%2Fr912 isPartOf "Semiconductor measurement technology".
- 89600743%2F%2Fr912 issued "1989".
- 89600743%2F%2Fr912 issued "[1989]".
- 89600743%2F%2Fr912 language "eng".
- 89600743%2F%2Fr912 publisher "Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O.,".
- 89600743%2F%2Fr912 subject "602/.18 s 535.5/2 20".
- 89600743%2F%2Fr912 subject "Ellipsometry Data processing.".
- 89600743%2F%2Fr912 subject "QC100 .U57 no. 400-83 QC443".
- 89600743%2F%2Fr912 title "A software program for aiding the analysis of ellipsometric measurements, simple models / J.F. Marchiando.".
- 89600743%2F%2Fr912 type "text".