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- 90012865 contributor B6101014.
- 90012865 contributor B6101015.
- 90012865 created "1990.".
- 90012865 date "1990".
- 90012865 date "1990.".
- 90012865 dateCopyrighted "1990.".
- 90012865 description "Includes bibliographical references and index.".
- 90012865 extent "xviii, 507 p. :".
- 90012865 identifier "0895735059 (New York : alk. paper)".
- 90012865 identifier "3527268847 (Weinheim : alk. paper)".
- 90012865 issued "1990".
- 90012865 issued "1990.".
- 90012865 language "eng".
- 90012865 publisher "Weinheim, F.R.G. ; New York, NY, USA : VCH,".
- 90012865 subject "620.1/127 20".
- 90012865 subject "Electron microscopy Industrial applications.".
- 90012865 subject "Materials Microscopy.".
- 90012865 subject "TA417.23 .F83 1990".
- 90012865 title "Particle beam microanalysis : fundamentals, methods, and applications / E. Fuchs, H. Oppolzer, H. Rehme.".
- 90012865 type "text".