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- 90042223 contributor B6129414.
- 90042223 contributor B6129415.
- 90042223 created "1990.".
- 90042223 date "1990".
- 90042223 date "1990.".
- 90042223 dateCopyrighted "1990.".
- 90042223 description "Includes bibliographical references and indexes.".
- 90042223 extent "2 v. :".
- 90042223 identifier "0444884297(v. 1)".
- 90042223 issued "1990".
- 90042223 issued "1990.".
- 90042223 language "eng".
- 90042223 publisher "Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co.,".
- 90042223 subject "621.381/52 20".
- 90042223 subject "Materials Defects Congresses.".
- 90042223 subject "QC611.6.D4 I583 1989".
- 90042223 subject "Semiconductors Defects Congresses.".
- 90042223 title "Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 / edited by K. Sumino.".
- 90042223 type "text".