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- 90044597 contributor B6132278.
- 90044597 contributor B6132279.
- 90044597 created "c1990.".
- 90044597 date "1990".
- 90044597 date "c1990.".
- 90044597 dateCopyrighted "c1990.".
- 90044597 description "Includes bibliographical references and indexes.".
- 90044597 extent "xi, 269 p. :".
- 90044597 identifier "1558990739".
- 90044597 isPartOf "Materials Research Society symposia proceedings ; v. 184.".
- 90044597 isPartOf "Materials Research Society symposium proceedings, 0272-9172 ; v 184".
- 90044597 issued "1990".
- 90044597 issued "c1990.".
- 90044597 language "eng".
- 90044597 publisher "Pittsburgh, Pa. : Materials Research Society,".
- 90044597 subject "621.381/52 20".
- 90044597 subject "Semiconductors Failures Congresses.".
- 90044597 subject "Semiconductors Reliability Congresses.".
- 90044597 subject "TK7871.85 .D455 1990".
- 90044597 title "Degradation mechanisms in III-V compound semiconductor devices and structures : symposium held April 17-18, 1990, San Francisco, California, U.S.A. / editors, V. Swaminathan, S.J. Pearton, M.O. Manasreh.".
- 90044597 type "text".