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- 90053194 contributor B6140192.
- 90053194 contributor B6140193.
- 90053194 contributor B6140194.
- 90053194 created "c1990.".
- 90053194 date "1990".
- 90053194 date "c1990.".
- 90053194 dateCopyrighted "c1990.".
- 90053194 description "Includes bibliographical references and index.".
- 90053194 extent "268 p. :".
- 90053194 identifier "081940313X (pbk.)".
- 90053194 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 1266.".
- 90053194 isPartOf "SPIE proceedings series ; v. 1266".
- 90053194 issued "1990".
- 90053194 issued "c1990.".
- 90053194 language "eng".
- 90053194 publisher "Bellingham, Wash., USA : SPIE,".
- 90053194 subject "670.42/5 20".
- 90053194 subject "Engineering instruments Congresses.".
- 90053194 subject "Interferometry Industrial applications Congresses.".
- 90053194 subject "Optical detectors Industrial applications Congresses.".
- 90053194 subject "Optical measurements Congresses.".
- 90053194 subject "TA165 .I5 1990".
- 90053194 title "In-process optical measurements and industrial methods : 14-15 March 1990, the Hague, the Netherlands : proceedings, ECO3, the congress of EPS--European Physical Society, Europtica--the European Federation for Applied Optics, SPIE--the International Society for Optical Engineering / H. A. Macleod, Peter Langenbeck, chairs/editors ; cooperating organizations, ANRT--Association nationale de la recherche technique ... [et al.].".
- 90053194 type "text".