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- 90055486 contributor B6141152.
- 90055486 contributor B6141153.
- 90055486 created "1990.".
- 90055486 date "1990".
- 90055486 date "1990.".
- 90055486 dateCopyrighted "1990.".
- 90055486 description "Includes bibliographical references and index.".
- 90055486 extent "xvi, 1083 p. :".
- 90055486 identifier "081869064X".
- 90055486 issued "1990".
- 90055486 issued "1990.".
- 90055486 language "eng".
- 90055486 publisher "Los Alamitos, Calif. : IEEE Computer Society Press,".
- 90055486 subject "621.381/5 20".
- 90055486 subject "Automatic test equipment Congresses.".
- 90055486 subject "Electronic digital computers Circuits Testing Congresses.".
- 90055486 subject "Integrated circuits Testing Congresses.".
- 90055486 subject "Semiconductors Testing Congresses.".
- 90055486 subject "TK7874 .I474 1990".
- 90055486 title "The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.".
- 90055486 type "text".