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- 90162932 contributor B6220543.
- 90162932 contributor B6220544.
- 90162932 contributor B6220545.
- 90162932 created "1989.".
- 90162932 date "1989".
- 90162932 date "1989.".
- 90162932 dateCopyrighted "1989.".
- 90162932 description "Includes bibliographical references and indexes.".
- 90162932 extent "xii, 505 p. :".
- 90162932 identifier "0444886192".
- 90162932 isPartOf "European Materials Research Society symposia proceedings ; v. 9".
- 90162932 issued "1989".
- 90162932 issued "1989.".
- 90162932 language "eng".
- 90162932 publisher "Amsterdam ; New York : North-Holland ; New York, NY, USA : Sole distributors for the USA and Canada, Elsevier Science Pub. Co.,".
- 90162932 subject "620.1/93 20".
- 90162932 subject "QC611.8.S5 S95 1989".
- 90162932 subject "Semiconductors Defects Congresses.".
- 90162932 subject "Silicon Defects Congresses.".
- 90162932 title "Defects in silicon : proceedings of Symposium B on Science and Technology of Defects in Silicon of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989 / edited by C.A.J. Ammerlaan, A. Chantre, P. Wagner.".
- 90162932 type "text".