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- 90172015 alternative "X-ray diffraction diagnostic of submicron layers.".
- 90172015 contributor B6230284.
- 90172015 contributor B6230285.
- 90172015 created "1989.".
- 90172015 date "1989".
- 90172015 date "1989.".
- 90172015 dateCopyrighted "1989.".
- 90172015 description "Includes bibliographical references (p. 146-151).".
- 90172015 extent "151, [1] p. :".
- 90172015 identifier "5020140201 :".
- 90172015 issued "1989".
- 90172015 issued "1989.".
- 90172015 language "rus eng".
- 90172015 language "rus".
- 90172015 subject "Semiconductors Testing.".
- 90172015 subject "TK7871.85 .A357 1989".
- 90172015 subject "X-rays Diffraction.".
- 90172015 title "Rentgenodifrakt︠s︡ionnai︠a︡ diagnostika submikronnykh sloev / A.M. Afanasʹev, P.A. Aleksandrov, R.M. Imamov.".
- 90172015 type "text".