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- 90602006 contributor B6296036.
- 90602006 contributor B6296037.
- 90602006 created "1990.".
- 90602006 date "1990".
- 90602006 date "1990.".
- 90602006 dateCopyrighted "1990.".
- 90602006 description "Includes bibliographical references (p. 68-72).".
- 90602006 extent "v, 72 p. :".
- 90602006 isPartOf "NIST special publication ; 400-86".
- 90602006 isPartOf "Semiconductor measurement technology".
- 90602006 issued "1990".
- 90602006 issued "1990.".
- 90602006 language "eng".
- 90602006 publisher "Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O.,".
- 90602006 subject "602/.18 s 621.381/5282 20".
- 90602006 subject "Integrated circuits Testing.".
- 90602006 subject "Power transistors Thermal properties.".
- 90602006 subject "QC100 .U57 no. 400-86 TK7871.92".
- 90602006 subject "Temperature measurements.".
- 90602006 title "Thermal resistance measurements / Frank F. Oettinger and David L. Blackburn.".
- 90602006 type "text".