Matches in Library of Congress for { <http://lccn.loc.gov/91015225> ?p ?o. }
Showing items 1 to 23 of
23
with 100 items per page.
- 91015225 contributor B6366152.
- 91015225 contributor B6366153.
- 91015225 created "c1991.".
- 91015225 date "1991".
- 91015225 date "c1991.".
- 91015225 dateCopyrighted "c1991.".
- 91015225 description "Includes bibliographical references and index.".
- 91015225 extent "xii, 184 p. :".
- 91015225 identifier "0792391659 (acid-free paper)".
- 91015225 isPartOf "Kluwer international series in engineering and computer science ; SECS 140.".
- 91015225 isPartOf "Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.".
- 91015225 isPartOf "The Kluwer international series in engineering and computer science ; SECS 140. VLSI, computer architecture, and digital signal processing".
- 91015225 issued "1991".
- 91015225 issued "c1991.".
- 91015225 language "eng".
- 91015225 publisher "Boston : Kluwer Academic Publishers,".
- 91015225 subject "621.39/5 20".
- 91015225 subject "Automatic test equipment.".
- 91015225 subject "Digital integrated circuits Testing Data processing.".
- 91015225 subject "Logic circuits Testing.".
- 91015225 subject "TK7868.L6 C44 1991".
- 91015225 title "Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell.".
- 91015225 type "text".