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- 91017832 alternative "Speckle metrology.".
- 91017832 contributor B6369235.
- 91017832 contributor B6369236.
- 91017832 created "c1991.".
- 91017832 date "1991".
- 91017832 date "c1991.".
- 91017832 dateCopyrighted "c1991.".
- 91017832 description "Includes bibliographical references and indexes.".
- 91017832 extent "xviii, 668 p. :".
- 91017832 identifier "0819406384 (hardbound)".
- 91017832 identifier "0819406392 (softbound)".
- 91017832 isPartOf "SPIE milestone series ; v. MS 35".
- 91017832 issued "1991".
- 91017832 issued "c1991.".
- 91017832 language "eng".
- 91017832 publisher "Bellingham, Wash., USA : SPIE Optical Engineering Press,".
- 91017832 subject "681/.2 20".
- 91017832 subject "Holographic interferometry.".
- 91017832 subject "Speckle metrology.".
- 91017832 subject "TA1555 .S45 1991".
- 91017832 title "Selected papers on speckle metrology / Rajpal S. Sirohi, editor.".
- 91017832 type "text".