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- 91020173 contributor B6372018.
- 91020173 created "c1991.".
- 91020173 date "1991".
- 91020173 date "c1991.".
- 91020173 dateCopyrighted "c1991.".
- 91020173 description "Includes bibliographical references and indexes.".
- 91020173 extent "xiv, 837 p. :".
- 91020173 identifier "0824785568 (acid-free paper)".
- 91020173 identifier 91020173-d.html.
- 91020173 isPartOf "Optical engineering (Marcel Dekker, Inc.) ; v. 29.".
- 91020173 isPartOf "Optical engineering ; 29".
- 91020173 issued "1991".
- 91020173 issued "c1991.".
- 91020173 language "eng".
- 91020173 publisher "New York : M. Dekker,".
- 91020173 subject "502/.8/25 20".
- 91020173 subject "Electron microscopy.".
- 91020173 subject "Field ion microscopy.".
- 91020173 subject "Microprobe analysis.".
- 91020173 subject "QH212.E4 M87 1991".
- 91020173 title "Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.".
- 91020173 type "text".