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- 91032602%2F%2Fr96 contributor B6386799.
- 91032602%2F%2Fr96 contributor B6386800.
- 91032602%2F%2Fr96 created "c1992.".
- 91032602%2F%2Fr96 date "1992".
- 91032602%2F%2Fr96 date "c1992.".
- 91032602%2F%2Fr96 dateCopyrighted "c1992.".
- 91032602%2F%2Fr96 description "Includes bibliographical references (p. [109]-125) and index.".
- 91032602%2F%2Fr96 extent "xviii, 132 p. :".
- 91032602%2F%2Fr96 identifier "0792392221 (acid-free paper)".
- 91032602%2F%2Fr96 isPartOf "Kluwer international series in engineering and computer science ; SECS 157.".
- 91032602%2F%2Fr96 isPartOf "Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.".
- 91032602%2F%2Fr96 isPartOf "The Kluwer international series in engineering and computer science ; SECS 157. VLSI, computer architecture, and digital signal processing".
- 91032602%2F%2Fr96 issued "1992".
- 91032602%2F%2Fr96 issued "c1992.".
- 91032602%2F%2Fr96 language "eng".
- 91032602%2F%2Fr96 publisher "Boston : Kluwer Academic,".
- 91032602%2F%2Fr96 subject "621.381/5 20".
- 91032602%2F%2Fr96 subject "Digital integrated circuits Testing.".
- 91032602%2F%2Fr96 subject "Integrated circuits Fault tolerance.".
- 91032602%2F%2Fr96 subject "TK7874 .B85 1992".
- 91032602%2F%2Fr96 title "Assessing fault model and test quality / by Kenneth M. Butler and M. Ray Mercer.".
- 91032602%2F%2Fr96 type "text".