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- 91042917 contributor B6398392.
- 91042917 created "c1992.".
- 91042917 date "1992".
- 91042917 date "c1992.".
- 91042917 dateCopyrighted "c1992.".
- 91042917 description "Includes bibliographical references and index.".
- 91042917 extent "xiii, 334 p. :".
- 91042917 identifier "0442001215".
- 91042917 issued "1992".
- 91042917 issued "c1992.".
- 91042917 language "eng".
- 91042917 publisher "New York : Van Nostrand Reinhold,".
- 91042917 subject "621.3815/2 20".
- 91042917 subject "Metal oxide semiconductors Design and construction.".
- 91042917 subject "Metal oxide semiconductors Reliability.".
- 91042917 subject "TK7871.99.M44 H68 1992".
- 91042917 title "Hot carrier design considerations for MOS devices and circuits / edited by Cheng T. Wang.".
- 91042917 type "text".