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- 92023433%2F%2Fr962 contributor B6638513.
- 92023433%2F%2Fr962 created "c1993.".
- 92023433%2F%2Fr962 date "1993".
- 92023433%2F%2Fr962 date "c1993.".
- 92023433%2F%2Fr962 dateCopyrighted "c1993.".
- 92023433%2F%2Fr962 description "Includes bibliographical references and indexes.".
- 92023433%2F%2Fr962 extent "vii, 199 p. :".
- 92023433%2F%2Fr962 identifier "0893917818 (cl)".
- 92023433%2F%2Fr962 isPartOf "VLSI design automation series".
- 92023433%2F%2Fr962 issued "1993".
- 92023433%2F%2Fr962 issued "c1993.".
- 92023433%2F%2Fr962 language "eng".
- 92023433%2F%2Fr962 publisher "Norwood, NJ : Ablex Pub. Corp.,".
- 92023433%2F%2Fr962 subject "621.39/5 20".
- 92023433%2F%2Fr962 subject "Electric fault location.".
- 92023433%2F%2Fr962 subject "Integrated circuits Very large scale integration Testing Data processing.".
- 92023433%2F%2Fr962 subject "TK7874 .V5625 1993".
- 92023433%2F%2Fr962 title "VLSI fault modeling and testing techniques / edited by George W. Zobrist.".
- 92023433%2F%2Fr962 type "text".