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- 92035547 contributor B6652617.
- 92035547 created "c1993.".
- 92035547 date "1993".
- 92035547 date "c1993.".
- 92035547 dateCopyrighted "c1993.".
- 92035547 description "Includes bibliographical references (p. 138-146) and index.".
- 92035547 extent "xxiv, 167 p. :".
- 92035547 identifier "0792393066 (acid-free paper)".
- 92035547 isPartOf "Kluwer international series in engineering and computer science ; SECS 208.".
- 92035547 isPartOf "Kluwer international series in engineering and computer science. Microelectronics manufacturing.".
- 92035547 isPartOf "The Kluwer internatioanl series in engineering and computer science ; SECS 208. Microelectronics manufacturing".
- 92035547 issued "1993".
- 92035547 issued "c1993.".
- 92035547 language "eng".
- 92035547 publisher "Boston : Kluwer Academic Publishers,".
- 92035547 subject "621.3815 20".
- 92035547 subject "Integrated circuits Very large scale integration Computer-aided design.".
- 92035547 subject "Integrated circuits Very large scale integration Defects Mathematical models.".
- 92035547 subject "TK7874 .P53 1993".
- 92035547 title "Integrated circuit defect-sensitivity : theory and computational models / by José Pineda de Gyvez.".
- 92035547 type "text".