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- 92039926 contributor B6657705.
- 92039926 created "c1993.".
- 92039926 date "1993".
- 92039926 date "c1993.".
- 92039926 dateCopyrighted "c1993.".
- 92039926 description "Includes bibliographical references and index.".
- 92039926 extent "120 p. :".
- 92039926 identifier "0792393155".
- 92039926 identifier 92039926-d.html.
- 92039926 isPartOf "Frontiers in electronic testing".
- 92039926 issued "1993".
- 92039926 issued "c1993.".
- 92039926 language "eng".
- 92039926 publisher "Boston : Kluwer Academic Publishers,".
- 92039926 subject "621.39/5 20".
- 92039926 subject "Iddq testing.".
- 92039926 subject "Integrated circuits Very large scale integration Testing.".
- 92039926 subject "Metal oxide semiconductors, Complementary Testing.".
- 92039926 subject "TK7874 .I3223 1993".
- 92039926 title "IDDQ testing of VLSI circuits / edited by Ravi K. Gulati and Charles F. Hawkins.".
- 92039926 type "text".