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- 92070488 alternative "Reliability of semiconductor devices/interconnections and dielectric breakdown and laser process for microelectronic applications.".
- 92070488 contributor B6675918.
- 92070488 contributor B6675919.
- 92070488 created "c1992.".
- 92070488 date "1992".
- 92070488 date "c1992.".
- 92070488 dateCopyrighted "c1992.".
- 92070488 description "Includes bibliographical references and indexes.".
- 92070488 extent "viii, 330 p. :".
- 92070488 identifier "1566770033".
- 92070488 isPartOf "Proceedings (Electrochemical Society) ; 92-4.".
- 92070488 isPartOf "Proceedings ; v. 92-4".
- 92070488 issued "1992".
- 92070488 issued "c1992.".
- 92070488 language "eng".
- 92070488 publisher "Pennington, NJ : Electrochemical Society,".
- 92070488 subject "621.3815/2 20".
- 92070488 subject "Dielectric devices Reliability Congresses.".
- 92070488 subject "Lasers Industrial applications Congresses.".
- 92070488 subject "Semiconductors Reliability Congresses.".
- 92070488 subject "TK7871.85 .P7487 1992".
- 92070488 title "Proceedings of the symposia on reliability of semiconductor devices/interconnections and dielectric breakdown, and laser process for microelectronic applications / edited by Hazara S. Rathore, G.S. Mathad, Du B. Nguyen.".
- 92070488 type "text".