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- 92072292 contributor B6677486.
- 92072292 created "c1992.".
- 92072292 date "1992".
- 92072292 date "c1992.".
- 92072292 dateCopyrighted "c1992.".
- 92072292 description "Includes bibliographical references and index.".
- 92072292 extent "vii, 280 p. :".
- 92072292 identifier "1563960826".
- 92072292 isPartOf "AIP conference proceedings ; no. 263.".
- 92072292 isPartOf "American Vacuum Society series ; 13".
- 92072292 isPartOf "Conference proceedings ; no. 263".
- 92072292 issued "1992".
- 92072292 issued "c1992.".
- 92072292 language "eng".
- 92072292 publisher "New York : American Institute of Physics,".
- 92072292 subject "621.3815/2 20".
- 92072292 subject "Aluminum films Congresses.".
- 92072292 subject "Metallic films Congresses.".
- 92072292 subject "Metallizing Congresses.".
- 92072292 subject "Semiconductors Defects Congresses.".
- 92072292 subject "TK7871.85 .S765 1992".
- 92072292 subject "Thin film devices Defects Congresses.".
- 92072292 title "Stress-induced phenomena in metallization : first international workshop, Ithaca, NY, 1991 / editors, Che-Yu Li, Paul Totta, Paul Ho.".
- 92072292 type "text".