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- 92073585 contributor B6678641.
- 92073585 contributor B6678642.
- 92073585 created "c1992.".
- 92073585 date "1992".
- 92073585 date "c1992.".
- 92073585 dateCopyrighted "c1992.".
- 92073585 description "Includes bibliographical references and index.".
- 92073585 extent "xii, 1012 p. :".
- 92073585 identifier "0780307607 (casebound)".
- 92073585 identifier "081863166X (microfiche)".
- 92073585 identifier "0818631678 (softbound)".
- 92073585 issued "1992".
- 92073585 issued "c1992.".
- 92073585 language "eng".
- 92073585 publisher "Altoona, PA : The Conference ; Piscataway, NJ : Can be ordered from IEEE Service Center,".
- 92073585 subject "621.3815/028/7 20".
- 92073585 subject "Automatic test equipment Congresses.".
- 92073585 subject "Integrated circuits Testing Congresses.".
- 92073585 subject "TK7874 .I474 1992".
- 92073585 title "Discover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.".
- 92073585 type "text".