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- 93007792 contributor B6898848.
- 93007792 created "c1993 (1997 printing)".
- 93007792 date "(1997 printing)".
- 93007792 date "1997".
- 93007792 date "c1993".
- 93007792 dateCopyrighted "c1993".
- 93007792 description "Includes bibliographical references and index.".
- 93007792 extent "xv, 404 p. :".
- 93007792 identifier "087170479X".
- 93007792 issued "1997".
- 93007792 issued "c1993".
- 93007792 language "eng".
- 93007792 publisher "Materials Park, OH : ASM International,".
- 93007792 subject "621.381028/7 20".
- 93007792 subject "Electronic apparatus and appliances Testing Handbooks, manuals, etc.".
- 93007792 subject "Electronics Materials Testing Handbooks, manuals, etc.".
- 93007792 subject "Microelectronics Materials Defects Handbooks, manuals, etc.".
- 93007792 subject "Microelectronics Materials Testing Handbooks, manuals, etc.".
- 93007792 subject "Semiconductors Defects Handbooks, manuals, etc.".
- 93007792 subject "TK7871 .M52 1997".
- 93007792 title "Microelectronic failure analysis : desk reference / Thomas W. Lee, editor, Seshu V. Pabbisetty, editor.".
- 93007792 type "text".