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- 93015447 contributor B6907929.
- 93015447 contributor B6907930.
- 93015447 created "c1993.".
- 93015447 date "1993".
- 93015447 date "c1993.".
- 93015447 dateCopyrighted "c1993.".
- 93015447 description "Includes bibliographical references and index.".
- 93015447 extent "xvi, 212 p. :".
- 93015447 identifier "079239352X".
- 93015447 identifier 93015447-d.html.
- 93015447 identifier 93015447-t.html.
- 93015447 isPartOf "Kluwer international series in engineering and computer science ; SECS 227.".
- 93015447 isPartOf "Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.".
- 93015447 isPartOf "The Kluwer international series in engineering and computer science ; SECS 227. VLSI, computer architecture, and digital signal processing".
- 93015447 issued "1993".
- 93015447 issued "c1993.".
- 93015447 language "eng".
- 93015447 publisher "Boston : Kluwer Academic,".
- 93015447 subject "621.39/5 20".
- 93015447 subject "Hot carriers Reliability Mathematical models.".
- 93015447 subject "Integrated circuits Very large scale integration Defects Mathematical models.".
- 93015447 subject "Metal oxide semiconductors Reliability Mathematical models.".
- 93015447 subject "TK7874 .L334 1993".
- 93015447 title "Hot-carrier reliability of MOS VLSI circuits / by Yusuf Leblebici, Sung-Mo (Steve) Kang.".
- 93015447 type "text".