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- 93018555 contributor B6911554.
- 93018555 created "c1993.".
- 93018555 date "1993".
- 93018555 date "c1993.".
- 93018555 dateCopyrighted "c1993.".
- 93018555 description "Includes bibliographical references and index.".
- 93018555 extent "xvi, 462 p. :".
- 93018555 identifier "0306443600".
- 93018555 identifier 93018555-d.html.
- 93018555 identifier 93018555-t.html.
- 93018555 isPartOf "Microdevices".
- 93018555 issued "1993".
- 93018555 issued "c1993.".
- 93018555 language "eng".
- 93018555 publisher "New York : Plenum Press,".
- 93018555 subject "621.3815/48 20".
- 93018555 subject "Electron beams Industrial applications.".
- 93018555 subject "Scanning electron microscopes.".
- 93018555 subject "Semiconductors Testing.".
- 93018555 subject "TK7871.85 .E426 1993".
- 93018555 title "Electron beam testing technology / edited by John T.L. Thong.".
- 93018555 type "text".