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- 93080010 contributor B6956343.
- 93080010 contributor B6956344.
- 93080010 created "c1993.".
- 93080010 date "1993".
- 93080010 date "c1993.".
- 93080010 dateCopyrighted "c1993.".
- 93080010 description "Includes bibliographical references and index.".
- 93080010 extent "xii, 1065 p. :".
- 93080010 identifier "0780314298 (softbound)".
- 93080010 identifier "0780314301 (casebound)".
- 93080010 identifier "078031431X (microfiche)".
- 93080010 issued "1993".
- 93080010 issued "c1993.".
- 93080010 language "eng".
- 93080010 publisher "Altoona, PA : The Conference ; Piscataway, NJ : Can be ordered from IEEE Service Center,".
- 93080010 subject "621.3815/028/7 20".
- 93080010 subject "Automatic test equipment Congresses.".
- 93080010 subject "Integrated circuits Testing Congresses.".
- 93080010 subject "TK7874 .I474 1993".
- 93080010 title "Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA / sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.".
- 93080010 type "text".